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Electromagnetic random field models for analysis of coupling inside mode tuned chambers

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2 Author(s)
C. Fiachetti ; Radar & Electromagnetism Dept., Univ. des Sci. de Limoges & ONERA, Toulouse, France ; B. Michielsen

The statistics of interference sources, induced by the electromagnetic fields of a mode tuned chamber (MTC), in electronic equipment is computed from the field's spatial covariance operator and a deterministic current distribution on the system under test. An example shows that the computed results, obtained with two canonical random field models, compare very well with measurements. In addition, a new and interesting relation between the variances of two-port S-parameters is established, which can be used to detect bad stirring in MTC.

Published in:

Electronics Letters  (Volume:39 ,  Issue: 24 )