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Using a log-normal failure rate distribution for worst case bound reliability prediction

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2 Author(s)
Bishop, P.G. ; Adelard & Centre for Software Reliability, UK ; Bloomfield, R.E.

Prior research has suggested that the failure rates of faults follow a log normal distribution. We propose a specific model where distributions close to a log normal arise naturally from the program structure. The log normal distribution presents a problem when used in reliability growth models as it is not mathematically tractable. However we demonstrate that a worst case bound can be estimated that is less pessimistic than our earlier worst case bound theory.

Published in:

Software Reliability Engineering, 2003. ISSRE 2003. 14th International Symposium on

Date of Conference:

17-20 Nov. 2003