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An SFS Berger check prediction ALU and its application to self-checking processor designs

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4 Author(s)
Lo, J.-C. ; Dept. of Electr. Eng., Rhode Island Univ., Kingston, RI, USA ; Thanawastien, S. ; Rao, T.R.N. ; Nicolaidis, M.

A strongly fault secure (SFS) ALU design based on the Berger check prediction (BCP) technique is presented. The fault and error models of a large class of VLSI ALU designs are discussed. The proposed design is proved to be fault-secure and self-testing with respect to any single fault in the ALU part. The proposed BCP ALU is proved to be SFS with any design of BCP circuit. Consequently, a self-checking processor whose data path is encoded entirely in a Berger code can be achieved. An efficient self-checking processor can then be designed

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Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:11 ,  Issue: 4 )