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Test-point selection algorithm using small signal model for scan-based BIST

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2 Author(s)
He Hu ; Inst. of Microelectron., Tsinghua Univ., Beijing, China ; Sun Yihe

A test point selection algorithm TEPSAUS (TEst-Point Selection Algorithm Using Small signal model) for scan based build-in self-test (BIST) is proposed in this paper, In order to reduce the computational complexity, the algorithm uses Small Signal Model (SSM) to build recursion formulas for cost reduction functions. With the recursion functions, the cost reduction functions can be calculated efficiently.

Published in:

Test Symposium, 2003. ATS 2003. 12th Asian

Date of Conference:

16-19 Nov. 2003