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Test response compression based on Huffman coding [logic IC testing]

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4 Author(s)
Ichihara, H. ; Fac. of Inf. Sci., Hiroshima City Univ., Japan ; Shintani, M. ; Ohara, T. ; Inoue, T.

Test compression/decompression is an efficient method for reducing the test application cost. In this paper, we propose a response compression method based on Huffman coding. The proposed method guarantees zero-aliasing because faulty responses are mapped into code words, not just fault-free ones. Moreover, the method is independent of the fault model and the structure of a circuit-under-test, and uses only the knowledge of the fault-free responses corresponding to a given test input set. Experimental results of the compression ratio and the size of the encoder for the proposed method are presented.

Published in:

Test Symposium, 2003. ATS 2003. 12th Asian

Date of Conference:

16-19 Nov. 2003