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A low-cost jitter measurement technique for BIST applications

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2 Author(s)
Jui-Jer Huang ; Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan ; Jiun-Lang Huang

In this paper, we present a technique to measure the RMS period jitter of the signal under test. In the proposed approach, the lead/lag relationships between the signal under test and two delayed versions of itself are compared. The collected information corresponds to two points along the jitter's cumulative distribution function (CDF) curve from which the RMS period jitter value can be derived. Currently, SPICE simulation results show less than 5% error for RMS jitter values ranging from 40 to 60 ps.

Published in:

Test Symposium, 2003. ATS 2003. 12th Asian

Date of Conference:

16-19 Nov. 2003