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Issues related to the formulation of DFT solution for analog circuit test using equivalent fault analysis

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1 Author(s)
Wong, M.W.T. ; Dept. of Electron. & Inf. Eng., Hong Kong Polytech. Univ., Kowloon, China

This paper identifies a few important points at which the application of equivalent fault analysis becomes the preferred choice in formulating a DFT solution for analog circuit test. These issues are important in that the test and/or design engineer should be aware of them in order to come up with effective test solutions to enhance fault diagnosis.

Published in:

Test Symposium, 2003. ATS 2003. 12th Asian

Date of Conference:

16-19 Nov. 2003