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Browse Conference Publications > Test Symposium, 2003. ATS 200 ... Help

Automated TTCN-3 test case generation by means of UML sequence diagrams and Markov chains

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3 Author(s)
Beyer, M. ; Inst. for Comput. Sci., Erlangen-Nurnberg Univ., Erlangen, Germany ; Dulz, W. ; Fenhua Zhen

The objective of this paper is to automatically generate a MCUM (Markov chain usage model) starting from an OMG UML-SD (sequence diagram) in order to derive TTCN-3 (testing and test control notation version 3) compatible test case definitions. Our approach is a combination of statistical usage testing and specification-based testing. Within this paper, special attention is given to international standardized FDT notations, specifically UML-SD and MSC. We have also defined an XML-based representation format called MCML (Markov chain markup language) to build a common interface between various parts of the MaTeLo tool set. In the case of UML-SD, we use XMI descriptions in order to generate the desired MCML format.

Published in:
Test Symposium, 2003. ATS 2003. 12th Asian

Date of Conference: 16-19 Nov. 2003

Page(s):
102 - 105
ISSN :
1081-7735
Print ISBN:
0-7695-1951-2
INSPEC Accession Number:
7905563
Digital Object Identifier :
10.1109/ATS.2003.1250791
Product Type:
Conference Publications

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