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Array codes correcting a cluster of unidirectional errors for two-dimensional matrix symbols [identification technology]

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2 Author(s)
Kaneko, H. ; Graduate Sch. of Inf. Sci. & Eng., Tokyo Inst. of Technol., Japan ; Fujiwara, E.

This paper proposes two-dimensional unidirectional clustered error correcting codes suitable for high-density two-dimensional matrix symbols. These codes are capable of correcting unidirectional errors confined in a rectangle having lm rows and ln columns. Evaluation shows that the proposed codes have smaller number of check bits than the existing codes.

Published in:

Defect and Fault Tolerance in VLSI Systems, 2003. Proceedings. 18th IEEE International Symposium on

Date of Conference:

3-5 Nov. 2003

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