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Simultaneous thickness and group index measurement using optical low-coherence reflectometry

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2 Author(s)
Sorin, W.V. ; Hewlett-Packard Lab., Palo Alto, CA, USA ; Gray, D.F.

Using high-resolution optical reflectometry, group index and physical thickness can both be determined by precisely measuring optical time delays through a sample. Optical low-coherence reflectometry offers both the high-spatial resolution and large dynamic range required to perform accurate measurements using this technique.<>

Published in:

Photonics Technology Letters, IEEE  (Volume:4 ,  Issue: 1 )