Cart (Loading....) | Create Account
Close category search window

Fuzzy complexity estimation of a nonlinear learning machine

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Novak, B. ; Electr. Eng., Comput. Sci. & Informatics Fac., Maribor Univ., Slovenia

Theories for a complexity estimation of different learning machines use the Vapnik Chervonenkis dimension, or various approximations to it, to predict optimal structure of a learning machine. This approach has some deficiencies that stems from Aristotelian logic foundation behind the Vapnik Chervonenkis dimension. An alternative fuzzy logic approach is introduced that brings a concise definition of errors and complexity estimation of a learning machine. In contradiction to the statistical learning theory where errors are actually counted in the fuzzy logic approach errors are measured. It is necessary to include information about the distances of violations about the quality of prediction. Some experiments are presented to evaluate a quality of propose algorithm.

Published in:

EUROCON 2003. Computer as a Tool. The IEEE Region 8  (Volume:2 )

Date of Conference:

22-24 Sept. 2003

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.