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VLSI circuit design with built-in reliability using simulation techniques

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3 Author(s)
W. -J. Hsu ; Dept. of Electr. Eng., Univ. of Southern Californa, Los Angeles, CA, USA ; S. M. Gowda ; B. J. Sheu

The use of reliability assurance and enhancement of integrated circuits in the design of high-performance electronic systems is discussed. Circuit simulators with embedded degradation models can be utilized to accurately predict VLSI reliability due to hot-carrier effects and electromigration. Basic design methods for constructing digital and analog circuit blocks with adequate built-in reliability are presented. Lifetime for DRAM circuitries and operational amplifiers can be significantly increased through these novel simulation techniques. Several practical VLSI design examples using an integrated-circuit reliability simulator are discussed

Published in:

Custom Integrated Circuits Conference, 1990., Proceedings of the IEEE 1990

Date of Conference:

13-16 May 1990