Cart (Loading....) | Create Account
Close category search window
 

Parametric contour estimation by simulated annealing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Jamieson, M. ; Dept. of Syst. Design Eng., Waterloo Univ., Ont., Canada ; Fieguth, P. ; Lee, L.J.

Virtually all implementations of simulated annealing are simplified by assuming discrete unknowns, however continuous-parameter annealing has many potential applications to image processing. Widely scattered problems such as formant tracking, boundary estimation and phase- unwrapping can all be approached as the annealed minimizations of continuous B-spline parameters. The benefits of simulated annealing are well known, including an insensitivity to initial conditions and the ability to solve problems with many local minima. Discrete variable annealing has seen broad application, however continuous-variable annealing is limited by the computational challenge of Gibbs sampling. In this paper we develop efficient approaches to sampling, illustrated in the context of contour tracking in noisy images.

Published in:

Image Processing, 2003. ICIP 2003. Proceedings. 2003 International Conference on  (Volume:3 )

Date of Conference:

14-17 Sept. 2003

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.