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Noncontact testing of circuits via a laser-induced plasma electrical pathway

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3 Author(s)
Millard, D.L. ; Rensselaer Polytech. Inst., Troy, NY, USA ; Umstadter, K.R. ; Block, R.C.

Systems using the three most popular probes applied to functional electrical testing, mechanical, electron beam, and laser, are reviewed. A system of noncontact testing that uses a laser-induced plasma 'switch' to provide the electrical pathway for AD and DC measurements on printed wiring boards is presented. With this technique, a DC resistance discrimination of less than 10 Omega and distortion-free AC measurements of a 2.5-MHz oscillator signal were achieved. These results are presented and evaluated.<>

Published in:

Design & Test of Computers, IEEE  (Volume:9 ,  Issue: 1 )