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Analog circuit fault diagnosis based on sensitivity computation and functional testing

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2 Author(s)
Slamani, M. ; Ecole Polytech. de Montreal, Que., Canada ; Kaminska, B.

An approach based on functional testing and on sensitivity calculation of many output parameters for diagnosis of defective elements in analog circuits is presented. A sensitivity matrix that gives the relation between the deviation of output parameters and the deviation of defective components in a circuit forms the basis of the test equations. Diverse types of measurement help improve the diagnostic resolution. Experimental results are presented to clarify the algorithm and prove its efficiency in a practical case.<>

Published in:

Design & Test of Computers, IEEE  (Volume:9 ,  Issue: 1 )