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Hidden Markov Models to identify pilot instrument scanning and attention patterns

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1 Author(s)
Hayashi, M. ; Dept. of Aeronaut. & Astronaut., Massachusetts Inst. of Technol., Cambridge, MA, USA

A previous study successfully demonstrated the potential usefulness of Hidden Markov Model (HMM) analysis techniques in analyzing pilots' eye-movement data to detect differences in scanning and attention patterns caused by display format changes. This paper focuses on assessing differences among pilots using the same display format. A flight simulator experiment was conducted with four pilots who had different levels of flight expertise. The analysis revealed variations in the HMM structures during the final descent segment: a 2-state HMM for the patterns of the least experienced pilot, a 3-state HMM for the two intermediate-level pilots, and a 4-state HMM for the most experienced pilot. The added "attitude-monitoring" state in the 4-state HMM reflected a flight technique well-known among experienced instrument pilots. HMM analysis methodology and interpretation issues are also discussed.

Published in:

Systems, Man and Cybernetics, 2003. IEEE International Conference on  (Volume:3 )

Date of Conference:

5-8 Oct. 2003