Cart (Loading....) | Create Account
Close category search window
 

Fast simulated diffusion: an optimization algorithm for multiminimum problems and its application to MOSFET model parameter extraction

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Sakurai, T. ; Semicond. Divice Eng. Lab., Toshiba Corp., Kawasaki, Japan ; Lin, B. ; Newton, A.R.

An optimization method, called fast simulated diffusion (FSD), is proposed to solve a multiminimial optimization problem on multidimensional continuous space. The algorithm performs a greedy search and a random search alternately and can find the global minimum with a practical success rate. An efficient hill-descending method employed as the greedy search in the FSD is proposed. When the FSD is applied to a set of standard test functions, it shows an order of magnitude faster speed than the conventional simulated diffusion. Some of the optimization problems encountered in system and VLSI designs are classified into multioptimal problems. The proposed FSD is successfully applied to a MOSFET parameter extraction problem with a deep submicron MOSFET

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:11 ,  Issue: 2 )

Date of Publication:

Feb 1992

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.