Cart (Loading....) | Create Account
Close category search window

"ATE open system platform" IEEE-P1552 structured architecture for test systems (SATS)

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Stora, M.J. ; Modular Integration Technol., Boonton, NJ, USA ; Droste, D.

The IEEE-P1552 structured architecture for test systems (SATS) standards effort, is a multidimensional ATE "open system platform" packaging specification. The standard defines data/signal/power interconnect mechanical/electrical mating connector requirements and common hardware packaging form factors. Addressed are plug&play wiring panels, switchable instrument/power mezzanine (IPM) modules, high speed serial bus control, and test bus matrix functionality, that permit subelement interchangeability and interoperability. The standard's functional performance requirements are limited to mechanical engagement, connector styles/footprints, electrical pin characteristics, and pin mapping definitions. As a higher order plug&play architecture, SATS supports legacy VXIbus and PXIbus architectures as hybrid subsystem integrations.

Published in:

AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. Proceedings

Date of Conference:

22-25 Sept. 2003

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.