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"ATE open system platform" IEEE-P1552 structured architecture for test systems (SATS)

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2 Author(s)
Stora, M.J. ; Modular Integration Technol., Boonton, NJ, USA ; Droste, D.

The IEEE-P1552 structured architecture for test systems (SATS) standards effort, is a multidimensional ATE "open system platform" packaging specification. The standard defines data/signal/power interconnect mechanical/electrical mating connector requirements and common hardware packaging form factors. Addressed are plug&play wiring panels, switchable instrument/power mezzanine (IPM) modules, high speed serial bus control, and test bus matrix functionality, that permit subelement interchangeability and interoperability. The standard's functional performance requirements are limited to mechanical engagement, connector styles/footprints, electrical pin characteristics, and pin mapping definitions. As a higher order plug&play architecture, SATS supports legacy VXIbus and PXIbus architectures as hybrid subsystem integrations.

Published in:
AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. Proceedings

Date of Conference: 22-25 Sept. 2003

Page(s):
85 - 94
ISSN :
1080-7725
Print ISBN:
0-7803-7837-7
INSPEC Accession Number:
7832462
Digital Object Identifier :
10.1109/AUTEST.2003.1243559
Product Type:
Conference Publications

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