Cart (Loading....) | Create Account
Close category search window
 

Colored timed Petri-net and GA based approach to modeling and scheduling for wafer probe center

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Shun-Yu Lin ; Dept. of Comput. Sci. & Inf. Eng., Nat. Taiwan Univ., Taipei, Taiwan ; Li-Chen Fu ; Tsung-Che Chiang ; Yi-Shiuan Shen

In this paper, we propose architecture to simulate wafer probe. We use a modeling tool named CTPN (colored-timed Petri nets) to model all testing flow. With CTPN model, we can predict the delivery date of any specific product under some scheduling policies efficiently and precisely. In the scheduling phase, we combine two popular methods to contract high-quality schedules. One is to select machines for lots and the other is to select lots for machines. In each method, we use the GA-based approach to search for the optimal combination of a number of heuristic rules. This CTPN-based GA scheduler and helps us to find the good solution so as to meet the requirements in the complicated environment.

Published in:

Robotics and Automation, 2003. Proceedings. ICRA '03. IEEE International Conference on  (Volume:1 )

Date of Conference:

14-19 Sept. 2003

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.