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SEU flight data from the CRRES MEP

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1 Author(s)
Campbell, A.B. ; US Naval Res. Lab., Washington, DC, USA

Analysis of single event upset data from the CRRES MEP from 27 July 1990 through 26 March 1991 has shown that upsets are being observed each orbit, the 93422 and 93L422 bipolar RAMs are the most sensitive devices, proton upsets in the radiation belts predominate over cosmic ray upsets, and many devices exhibit multiple bit upsets

Published in:

Nuclear Science, IEEE Transactions on  (Volume:38 ,  Issue: 6 )