By Topic

Radiation damage assessment of Nb tunnel junction devices

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
King, S.E. ; US Naval Res. Lab., Washington, DC, USA ; Magno, Richard ; Maisch, W.G.

The radiation hardness of a new technology using Josephson junctions was explored by an irradiation using a fluence of 7.6×10 14 protons/cm2 at an energy of 63 MeV from the U.C. Davis cyclotron. In what may be the first radiation assessment of Nb/Al2O3/Nb devices, the permanent damage in these devices was investigated. No permanent changes in the I-V characteristics of the junctions were observed, indicating no significant level of material defects have occurred at this level of irradiation

Published in:

Nuclear Science, IEEE Transactions on  (Volume:38 ,  Issue: 6 )