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Aggressive test power reduction through test stimuli transformation

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2 Author(s)
Sinanoglu, O. ; Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA ; Orailoglu, A.

Excessive switching activity during shift cycles in scan-based cores imposes considerable test power challenges. To ensure rapid and reliable test of SOCs, we propose a scan chain modification methodology that transforms the stimuli to be inserted to the scan chain through logic gate insertion between scan cells, reducing scan chain transitions. We introduce a novel matrix band algebra to formulate the impact of scan chain modifications on test stimuli transformations. Based on this analysis, we develop algorithms for transforming a set of test vectors into power-optimal test stimuli through cost-effective scan chain modifications. Experimental results show that scan-in power reductions exceeding 90% for test vectors and 99.5% for test cubes can be attained by the proposed methodology.

Published in:

Computer Design, 2003. Proceedings. 21st International Conference on

Date of Conference:

13-15 Oct. 2003