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Multiple fault diagnosis using n-detection tests

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4 Author(s)
Z. Wang ; Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA ; M. Marek-Sadowska ; K. -H. Tsai ; J. Rajski

We study the relationship between multiple fault diagnosability and fault detection count. Instead of developing a complex diagnostic algorithm for multiple fault behavior, we change the test sets used in test and diagnosis. This allows us to apply a simple single-fault based diagnostic algorithm, and yet achieve very good diagnosability for the failure test cases caused by multiple faults. We have verified experimentally the effectiveness of n-detection tests for multiple-fault cases and explained the results in probabilistic terms.

Published in:

Computer Design, 2003. Proceedings. 21st International Conference on

Date of Conference:

13-15 Oct. 2003