Cart (Loading....) | Create Account
Close category search window

Accuracy verification and enhancement in 3D modeling: application to Donatello's Maddalena

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Guidi, G. ; DET, Univ. degli Studi di Firenze, Florence, Italy ; Cioci, A. ; Atzeni, C. ; Beraldin, J.-A.

The three-dimensional acquisition and modeling of Donatello's Maddalena was started in order to create a methodology that aims at monitoring fragile wooden sculptures over the years. Hence a set of new approaches in 3D modeling was needed for obtaining the necessary metric reliability. The main focus of the work is modeling accuracy, therefore quality control procedures based both of the self check of 3D data and the use of complementary 3D sensors were developed for testing the model. Sensor fusion was also extensively used in order to correct a few alignment errors after the ICP phase leading to a not negligible overall metric discrepancy. All the steps of the acquisition procedure, from the project planning to the solution of the various technical and logistical problems are reported. Although few commercial systems claim to use a similar approach, for the first time, the noninvasive integration of photogrammetry and 3D scanning, specifically designed for applications in cultural heritage, is extensively documented here.

Published in:

3-D Digital Imaging and Modeling, 2003. 3DIM 2003. Proceedings. Fourth International Conference on

Date of Conference:

6-10 Oct. 2003

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.