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In this work, a built-in self-testing (BIST) method is proposed to detect nontraditional faults of embedded memory arrays for a system-on-chip (SoC) design. The nontraditional faults include single-cell read-sensitive faults and read coupling faults. The BIST method can efficiently deal with embedded memory arrays spatially distributed on the entire SoC chip. The concept of redundant read-write operations is applied to detect all embedded memory arrays with different sizes simultaneously. The redundant operations do not affect the fault coverage of all nontraditional faults discussed in this paper. The method has the advantages of low hardware overhead, short test time, and high fault coverage for nontraditional memory defects.