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Browse Conference Publications > Compound Semiconductors, 2003 ... Help

Micro-Raman scattering study on strain induced by compositional variation in single crystalline Si1-xGex discs

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2 Author(s)
Islam, M.R. ; Dept. of Electron. & Inf. Sci., Kyoto Inst. of Technol., Japan ; Yamada, M.

In this paper we report for the first time micro-Raman scattering study on the residual strain in single crystalline Si1-xGex.

Published in:
Compound Semiconductors, 2003. International Symposium on

Date of Conference: 25-27 Aug. 2003

Page(s):
185 - 186
Print ISBN:
0-7803-7820-2
INSPEC Accession Number:
7823746
Digital Object Identifier :
10.1109/ISCS.2003.1239967
Product Type:
Conference Publications

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