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Toward nanometer-scale resolution in fluorescence microscopy using spectral self-interference

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8 Author(s)
Swan, A.K. ; Electr. & Comput. Eng. Dept., Boston Univ., MA, USA ; Moiseev, L.A. ; Cantor, C.R. ; Davis, B.
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We introduce a new fluorescence microscopy technique that maps the axial position of a fluorophore with subnanometer precision. The interference of the emission of fluorophores in proximity to a reflecting surface results in fringes in the fluorescence spectrum that provide a unique signature of the axial position of the fluorophore. The nanometer sensitivity is demonstrated by measuring the height of a fluorescein monolayer covering a 12-nm step etched in silicon dioxide. In addition, the separation between fluorophores attached to the top or the bottom layer in a lipid bilayer film is determined. We further discuss extension of this microscopy technique to provide resolution of multiple layers spaced as closely as 10 nm for sparse systems.

Published in:

Selected Topics in Quantum Electronics, IEEE Journal of  (Volume:9 ,  Issue: 2 )

Date of Publication:

March-April 2003

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