By Topic

Modelling diffraction effects by the mode expansion method

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Petrovic, N.S. ; Sch. of Inf. Technol. & Electr. Eng., Queensland Univ., Brisbane, Qld., Australia ; Rakic, A.D.

An improvement in the information transfer rate (the amount of information communicated per unit area) in VCSEL-based free-space optical interconnects can be achieved by reducing the spacing between the microchannels. However, reducing the physical size of optical components results in an increase in diffractive spreading of laser beams and a decrease in the signal-to-noise ratio. The traditional methods used for describing diffraction phenomena tend to be rather cumbersome in most practical situations. However, the mode expansion method of Tanaka et al. (K. Tanaka, M. Shibukawa, O. Fukumitsu, IEEE Trans. Microwave Theory Tech. MTT-20, p749), applied in an improved form derived by the authors, is shown to be accurate and well suited for analysing the FSOI performance. It is also shown to consistently outperform the other approximate methods frequently used in the literature.

Published in:

Optoelectronic and Microelectronic Materials and Devices, 2002 Conference on

Date of Conference:

11-13 Dec. 2002