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A systematic method for modifying march tests for bit-oriented memories into tests for word-oriented memories

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2 Author(s)
A. J. van de Goor ; Dept. of Inf. Technol. & Syst., Delft Univ. of Technol., Netherlands ; I. B. S. Tlili

Most memory test algorithms are optimized for a particular memory technology and a particular set of fault models, under the assumption that the memory is bit-oriented, i.e., read and write operations affect only a single bit in the memory. Traditionally, word-oriented memories have been tested by repeated application of a test for bit-oriented memories, whereby a different data background is used during each application. This results in time inefficiencies and limited fault coverage. A systematic way of converting tests for bit-oriented memories into tests for word-oriented memories is presented, distinguishing between interword and intraword faults. The conversion consists of concatenating to the test for interword faults, a test for intraword faults. This approach results in more efficient tests with complete coverage of the targeted faults. Word-oriented memory tests are very important, because most memories have an external data path which is wider than one bit.

Published in:

IEEE Transactions on Computers  (Volume:52 ,  Issue: 10 )