By Topic

Comparison of adaptive body bias (ABB) and adaptive supply voltage (ASV) for improving delay and leakage under the presence of process variation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
T. Chen ; Dept. of Electr. & Comput. Eng., Colorado State Univ., Fort Collins, CO, USA ; S. Naffziger

Process variations as a percentage of nominal delay and power consumption are becoming more and more severe with continuing scaling of VLSI technology. The worsening process variation causes increased variability in performance, power, and reliability of VLSI circuits. Thus, performance and power consumption targets obtained during the design phase of VLSI circuits may significantly deviate from that of actual silicon resulting in significant yield losses. Adaptive body bias (ABB) has been shown to be an effective method of postsilicon tuning to reduce variability under the presence of process variation. Post silicon tuning can also be accomplished by using adaptive supply voltage (ASV). This paper compares the effectiveness of ABB and ASV in reducing variability and improving performance and power, and thus, yield.

Published in:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems  (Volume:11 ,  Issue: 5 )