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Circuit yield of organic integrated electronics

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9 Author(s)
E. Cantatore ; Philips Res., Eindhoven, Netherlands ; C. M. Hart ; M. Digioia ; G. H. Gelinck
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Research on organic electronics is focussed on materials and on the performance of discrete devices. Reliability and circuit yield is largely unexplored. Yield, based on measurements on digital organic circuits up to 1000 transistors, is described. The causes of yield loss are analyzed and design solutions to improve the yield are discussed.

Published in:

Solid-State Circuits Conference, 2003. Digest of Technical Papers. ISSCC. 2003 IEEE International

Date of Conference:

13-13 Feb. 2003