Cart (Loading....) | Create Account
Close category search window
 

Test data compression based on input-output dependence

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Pomeranz, I. ; Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA ; Reddy, S.M.

We use the fact that outputs of a large circuit depend on proper subsets of the circuit inputs to provide test data compression on the input side. The compressed input test data consists of patterns of length equal to the maximum number of inputs on which an output depends. This is typically smaller than the number of circuit inputs. A distribution block expands every input pattern into several test patterns for the circuit, one test pattern for every input pattern and input subset. We present experimental results to show that significant compression can be achieved by the proposed approach while maintaining complete fault coverage.

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:22 ,  Issue: 10 )

Date of Publication:

Oct. 2003

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.