By Topic

Soft X-ray resonant scattering: an element-specific tool to characterize patterned arrays of nanomagnets

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Sanchez-Hanke, C. ; Dept. of Mater. Sci. & Eng., Massachusetts Inst. of Technol., Cambridge, MA, USA ; Castano, Fernando J. ; Hao, Y. ; Hulbert, Steven L.
more authors

The authors have demonstrated the use of soft X-ray resonant scattering as an element-specific tool for characterizing the structure and magnetic properties of a rectangular array of nanomagnets. The periodicity and the size of individual elements of an array of Co dots were determined by measuring the intensities of a large number of diffraction orders and comparing them to model calculations performed within the framework of Fraunhoffer diffraction theory. Element-specific hysteresis loops along both the easy and hard axis of the array were measured by tuning the incident energy to the Co L3 absorption edge.

Published in:

Magnetics, IEEE Transactions on  (Volume:39 ,  Issue: 5 )