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In this paper, both simulations and measurements are used to explore the propagation properties of ultrahigh-frequency (UHF) waves traveling through building structures and, in particular, windows. The propagation influence of several features of a typical window structure is examined, including the electrical properties of the surrounding wall, the homogeneity and roughness of this wall, and the incidence angle of the UHF wave. In these studies, ray tracing is benchmarked against both narrow-band measurements and the results of a full-wave moment method technique. Some of the inherent limitations of ray tracing are assessed and corrective methods are proposed in order to improve its accuracy.