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This paper discusses RF calibration schemes for one-port vector network analyzers other than the traditional short-open-load (SOL) scheme. Before use, the impedance standards are characterized by fitting polynomials to measured voltage reflection coefficient values. Simulated uncertainty profiles and example uncertainties of measurement are presented for various calibration schemes. Examples of non-SOL schemes and a method of adaptively choosing the best calibration scheme for a particular device under test at a particular frequency are also presented.