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Obtaining high defect coverage for frequency-dependent defects in complex ASICs

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3 Author(s)
Madge, R. ; LSI Logic, Gresham, OR, USA ; Benware, B.R. ; Daasch, W.R.

Structured delay tests have been around for years, but how effectively do they identify defective silicon, even at reduced frequency? How much overkill is associated with their use? The authors present data from industrial circuits aimed at these and other aspects of speed testing.

Published in:

Design & Test of Computers, IEEE  (Volume:20 ,  Issue: 5 )