Referenced Items are not available for this document.
What would it take to reduce speed binning's dependency on functional testing? One answer is a structural at-speed test approach that can achieve the same effectiveness as functional testing. The authors of this article offer a formula to relate structural critical-path testing frequency to system operation frequency. They demonstrate that there can be a high correlation between frequencies resulting from structural testing and those resulting from functional testing.
Published in:
Design & Test of Computers, IEEE
(Volume:20
,
Issue:
5
)
Date of Publication: Sept.-Oct. 2003
- Page(s):
- 41 - 45
- ISSN :
- 0740-7475
- INSPEC Accession Number:
- 7758181
- Digital Object Identifier :
- 10.1109/MDT.2003.1232255
- Date of Current Version :
- 15 September 2003
- Issue Date :
- Sept.-Oct. 2003
- Sponsored by :
- IEEE Council on Electronic Design and Automation
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