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Programmable built-in self-testing of embedded RAM clusters in system-on-chip architectures

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5 Author(s)

Multiport memories are widely used as embedded cores in all communication system-on-chip devices. Due to their high complexity and very low accessibility, built-in self-test (BIST) is the most common solution implemented to test the different memories embedded in the system. This article presents a programmable BIST architecture based on a single microprogrammable BIST processor and a set of memory wrappers designed to simplify the test of a system containing a large number of distributed multiport memories of different sizes (number of bits, number of words), access protocols (asynchronous, synchronous), and timing.

Published in:

Communications Magazine, IEEE  (Volume:41 ,  Issue: 9 )

Date of Publication:

Sept. 2003

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