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Simultaneous magnetic force microscopy and magnetoresistance characterization of a magnetic tunnel junction with in-situ applied field

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6 Author(s)
Leib, J.S. ; Dept. of Mater. Sci. & Eng., Iowa State Univ., Ames, IA, USA ; Baker, B.J. ; Shen, Y.P. ; Snyder, J.E.
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In this paper, both the magneto-electronic properties and the magnetic domain structure of a magnetic tunnel junction (MJT) have been characterized simultaneously.

Published in:

Magnetics Conference, 2003. INTERMAG 2003. IEEE International

Date of Conference:

March 30 2003-April 3 2003