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Topographic and magnetic structure of undulated permalloy films measured in UHV

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3 Author(s)
Pandana, H. ; Maryland Univ., College Park, MD, USA ; Dreyer, M. ; Gomez, R.D.

In this article, we characterized the films by magnetic force microscopy (MFM), contact potential microscopy (CPM) as well as STM within the same UHV system.

Published in:

Magnetics Conference, 2003. INTERMAG 2003. IEEE International

Date of Conference:

March 30 2003-April 3 2003