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Sensitivity analysis of simulations for magnetic particle inspection using finite element method

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6 Author(s)
J. Y. Lee ; Center for Aviation Syst. Reliability, Iowa State Univ., Ames, IA, USA ; S. J. Lee ; D. C. Jiles ; M. Garton
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In this article, we report a sensitivity analysis of numerical simulations of MPI for defects with various sizes using the finite element analysis (FEM).

Published in:

Magnetics Conference, 2003. INTERMAG 2003. IEEE International

Date of Conference:

March 30 2003-April 3 2003