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Ion temperature measurement by using H/sub /spl alpha// line broadening in Hanbit mirror device

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3 Author(s)
S. J. Yoo ; Korea Basic Sci. Inst., Daejeon, South Korea ; W. H. Ko ; H. L. Yang

Summary form only given, as follows. Ion temperatures are determined from H/spl alpha/ line broadening measured by charge exchange recombination spectroscopy (CXRS) on Hanbit, a mirror device. The measured H/spl alpha/ line profile consists of the charge exchange emission of hot ions in plasma core and the emission from hydrogen atoms in plasma edges. Since the edge emission contributes to the line center and is relatively much larger than that of the charge exchange emission of hot ions, the line shape of the latter is submerged into the former when measured by an array detector such as a CCD detector. So, an optical fiber array detector has been developed in order to block out the central region of the line profile and to obtain a pure charge exchange line shape. The concept of the optical fiber array detector is described and the result of the ion temperature measurement is presented.

Published in:

Plasma Science, 2003. ICOPS 2003. IEEE Conference Record - Abstracts. The 30th International Conference on

Date of Conference:

5-5 June 2003