By Topic

Near-field probe measurements of microwave scattering from discontinuities in planar surfaces

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Schultz, J.W. ; Georgia Tech Res. Inst., Atlanta, GA, USA ; Hopkins, E.J. ; Kuster, E.J.

In microwave scattering, nonradiating fields may contribute to radiating fields by local perturbations such as geometric discontinuities or variations in impedance or electromagnetic properties. Near-field measurements of scattering bodies provide insight into these scattering mechanisms by measuring both radiated and nonradiated fields. In this research, an H-field probe measured scattering from simple discontinuities in planar bodies at frequencies between 2 and 10 GHz. Illumination of the test-body was furnished by a focused lens system with a Gaussian-like tapered beam that locally illuminated inhomogeneities on the body. Measured data and model calculations are presented for scattered H-fields near canonical discontinuities (e.g. gaps and edges in conducting planes). Calculations of the plane wave spectrum of the measured and modeled data were used to distinguish specular reflected components from surface modes. A focused beam was simulated in a finite-difference time-domain (FDTD) model with a weighted sum of plane waves. FDTD results agreed with the measured near-field data.

Published in:

Antennas and Propagation, IEEE Transactions on  (Volume:51 ,  Issue: 9 )