Cart (Loading....) | Create Account
Close category search window
 

Finding higher order motifs under the levenshtein measure

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Adebiyi, E.F. ; Dept. of Math. & Comput. Sci., Ilorin Univ., Nigeria ; Dipe, T.

We study the problem of finding higher order motifs under the levenshtein measure, otherwise known as the edit distance. In the problem set-up, we are given N sequences, each of average length n, over a finite alphabet Σ and thresholds D and q, we are to find composite motifs that contain motifs of length P (these motifs occur with almost D differences) in 1 ≤ q ≤ N distinct sequences. Two interesting but involved algorithms for finding higher order motifs under the edit distance was presented by Marsan and Sagot. Their second algorithm is much more complicated and its complexity is asymptotically not better. Their first algorithm runs in O(M · N2n1+α ·p · pow(ε)) where p ≥ 2, α > 0, pow(ε) is a concave function that is less than 1, ε= D/P and M is the expected number of all monad motifs. We present an alternative algorithmic approach also for Edit distance based on the concept described. The resulting algorithm is simpler and runs in O(N2n1+p · pow(ε)) expected time.

Published in:

Bioinformatics Conference, 2003. CSB 2003. Proceedings of the 2003 IEEE

Date of Conference:

11-14 Aug. 2003

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.