Cart (Loading....) | Create Account
Close category search window
 

The reliability of FPGA circuit designs in the presence of radiation induced configuration upsets

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Wirthlin, M. ; Dept. of Electr. & Comput. Eng., Brigham Young Univ., Provo, UT, USA ; Johnson, E. ; Rollins, N. ; Caffrey, M.
more authors

FPGAs are an appealing solution for space-based remote sensing applications. However, in a low-Earth orbit, FPGAs (field programmable gate arrays) are susceptible to Single-Event Upsets (SEUs). In an effort to understand the effects of SEUs, an SEU simulator based on the SLAAC-1V computing board has been developed. This simulator artificially upsets the configuration memory of an FPGA and measures its impact on FPGA designs. The accuracy of this simulation environment has been verified using ground-based radiation testing. This simulation tool is being used to characterize the reliability of SEU mitigation techniques for FPGAs.

Published in:

Field-Programmable Custom Computing Machines, 2003. FCCM 2003. 11th Annual IEEE Symposium on

Date of Conference:

9-11 April 2003

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.