Close category search window
 

Two color based face detection algorithms: a comparative approach

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Teodorescu, T.D. ; Fac. of Electron. & Telecommun., Tech. Univ. of Iasi, Romania ; Maiorescu, V.A. ; Nagel, J.-L. ; Ansorge, M.

In this communication, two color-based methods for detecting faces in various scenes are compared and improved in terms of detection speed and/or accuracy. The first method according to Y. Raja et al. (1998) consists in automatically calculating a face color model by using the Expectation Maximization (EM) algorithm in the Hue Saturation (HS) subspace. Pixels with the color of the face are used by the EM algorithm to find the location of the face(s). The second method consists in using the histogram backprojection method for calculating the face color probability for every pixel in the image according to J.B. Martinkauppi and M.N. Soriano (2001), J.B. Martinkauppi et al. (2001) and M.N. Soriano et al. (2000), the location of the face(s) being then determined from this information.

Published in:
Signals, Circuits and Systems, 2003. SCS 2003. International Symposium on  (Volume:1 )

Date of Conference: 10-11 July 2003

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.