Cart (Loading....) | Create Account
Close category search window
 

On the capacity and normalization of ISI channels

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Wei Xiang ; Inst. for Telecommun. Res., Univ. of South Australia, SA, Australia ; Pietrobon, S.S.

We investigate the capacity of various intersymbol interference (ISI) channels with additive white Gaussian noise (AWGN). Previous papers showed a minimum Eb/N0 of -4.6 dB, 3 dB below the capacity of a flat channel, is obtained using water-pouring capacity formulas for the 1+D channel. However, these papers did not take into account that the channel power gain can be greater than one when water-pouring is used. We present a generic power normalization method of the channel frequency response, namely, peak bandwidth normalization (PBN), to facilitate the fair capacity comparison of various ISI channels. Three types of ISI channel, i.e., adder channels, RC channels, and magnetic recording channels, are examined. By using our channel power gain normalization, the capacity curves of these ISI channels are shown.

Published in:

Information Theory, IEEE Transactions on  (Volume:49 ,  Issue: 9 )

Date of Publication:

Sept. 2003

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.