IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Conference Publications > Multiple-Valued Logic, 1990., ... Help

On the diagnosability of systems with three valued test results: diagnosis by comparison strategy

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Sengupta, A. ; Dept. of Comput. Sci., South Carolina Univ., Columbia, SC, USA ; Rhee, C.

A model of self-diagnosable multiprocessor systems, in which the faulty processors are determined by comparing the results of identical tasks performed by a pair of processors in the system, was introduced by J. Maeng and M. Malek (1981). An analysis is presented of the diagnosability problems for such a model when the result of comparison is three-valued. A set of criteria is given for determining whether the faulty processors in the system can be diagnosed on the basis of comparisons

Published in:
Multiple-Valued Logic, 1990., Proceedings of the Twentieth International Symposium on

Date of Conference: 23-25 May 1990

Page(s):
115 - 120
Meeting Date :
23 May 1990-25 May 1990
Print ISBN:
0-8186-2046-3
INSPEC Accession Number:
3842970
Conference Location :
Charlotte, NC
Digital Object Identifier :
10.1109/ISMVL.1990.122606
Product Type:
Conference Publications

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.