IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Conference Publications > Signal Processing and Its App ... Help

Referenced contrasts a new approach to the problem of blind source separation

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Adib, A. ; Inst. Sci., Rabat, Morocco ; Moreau, E. ; Aboutajdine, D.

We present a general theory for the closed-form parametric estimation of the unitary mixing matrix after prewhitening in the blind separation of source signals. The proposed methodology is based on the maximization of referenced contrast. We present a general method to construct a referenced contrast functions for blind source separation. It is based on an integration of a reference system to the separating scheme. Simulations in a variety of separation scenarios assess and validate the method studied.

Published in:
Signal Processing and Its Applications, 2003. Proceedings. Seventh International Symposium on  (Volume:2 )

Date of Conference: 1-4 July 2003

Page(s):
97 - 100 vol.2
Print ISBN:
0-7803-7946-2
INSPEC Accession Number:
8007492
Digital Object Identifier :
10.1109/ISSPA.2003.1224824

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.