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Mitigation of pattern-induced degradation in SOA-based all-optical OTDM demultiplexers by using RZ-DPSK modulation format

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4 Author(s)
Kit Chan ; Dept. of Inf. Eng., Chinese Univ. of Hong Kong, China ; Chun-Kit Chan ; Lian Kuan Chen ; F. Tong

In this letter, we propose and demonstrate to employ return-to-zero differential phase-shifted-keying (RZ-DPSK) modulation format in optical time-division-multiplexing (OTDM) systems so as to mitigate the pattern-induced degradation in semiconductor optical amplifier-based all-optical demultiplexers. Experimental results prove that RZ-DPSK can effectively alleviate such impairment with negligible induced power penalty, and thus, is more robust than the conventional RZ ON-OFF keying modulation format in OTDM systems.

Published in:

IEEE Photonics Technology Letters  (Volume:15 ,  Issue: 9 )